Magnus Ekdahl, Timo Koski.
Year: 2006, Volume: 7, Issue: 87, Pages: 2449−2480
In many pattern recognition/classification problem the true class conditional model and class probabilities are approximated for reasons of reducing complexity and/or of statistical estimation. The approximated classifier is expected to have worse performance, here measured by the probability of correct classification. We present an analysis valid in general, and easily computable formulas for estimating the degradation in probability of correct classification when compared to the optimal classifier. An example of an approximation is the Naïve Bayes classifier. We show that the performance of the Naïve Bayes depends on the degree of functional dependence between the features and labels. We provide a sufficient condition for zero loss of performance, too.